A production platform measures the optical and electrical characteristics of millions of emitters at wafer and final test.
Reporting and analysis UBI Research
Editor Dr. Choonghoon YI, CEO and Chief Analyst
Teradyne unveiled Iris 100, a production optical inspection platform for MicroLED devices, on September 21. The product measures every emitter in an array and integrates with the company’s UltraFLEXplus platform to perform optical and electrical testing in one system.
A MicroLED array contains hundreds of thousands to millions of individual emitters. Teradyne cited the difficulty of meeting production throughput and per-device inspection cost targets with laboratory bench equipment alone as a reason for developing the product.
Iris 100 uses a spectrometer and high-resolution camera to measure the array’s spectral response. It also examines brightness and uniformity pixel by pixel, recording the condition of each emitter.
Teradyne Iris 100 tests MicroLED emitters optically and electrically. Source: Teradyne
Parallel testing and image-processing algorithms are designed to analyze an entire array containing millions of MicroLEDs at high throughput. IG-XL software identifies dead pixels, stuck pixels and clustered defects early in the manufacturing process.
A calibration procedure with NIST traceability links absolute measurements across lots, wafers and production sites. The equipment supports both wafer and final testing; the roadmap also includes the ability to test photodetectors within the same inspection flow.
Teradyne lists MicroLED microdisplays for AR and optical data interconnects for AI data centers among the applications. The company introduced Iris 100 at its booth at ECOC 2026 in Málaga, Spain, held September 21–23.
Dr. Choonghoon YI, CEO and Chief Analyst of UBI Research, said, “In MicroLED mass production, the ability to rapidly measure each emitter and link the results to manufacturing data is critical. The key feature of Iris 100 is its integration of optical and electrical tests with an established semiconductor production test platform.”
Sources: Teradyne product materials; Business Wire (September 21, 2026)